Transmission electron microscopy and diffractometry of materials /

This textbook develops the concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. It emphasizes themes common to both techniques, such as scattering from atoms, wave interference, and the formation and analysis of d...

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Bibliographic Details

Main Author:	Fultz, B. (Brent)
Corporate Author:	SpringerLink (Online service)
Other Authors:	Howe, James M., 1955-
Format:	eBook
Language:	English
Published:	Berlin ; New York : Springer, [2002]
Edition:	Second edition.
Subjects:	Materials > Microscopy. Transmission electron microscopy. X-ray diffractometer. Electronic books.
Online Access:	Connect to the full text of this electronic book