Electron backscatter diffraction in materials science /

Electron backscatter diffraction (EBSD), when employed as an additional characterization technique to a scanning electron microscope (SEM), enables individual grain orientations, local texture, point-to-point orientation correlations, and phase identification and distributions to be determined routi...

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Bibliographic Details

Corporate Author:	SpringerLink (Online service)
Other Authors:	Schwartz, Adam J., Kumar, Mukul, Adams, B. L. (Brent L.)
Format:	eBook
Language:	English
Published:	New York : Kluwer Academic, [2000]
Subjects:	Materials > Microscopy. Scanning electron microscopy. Crystallography. Matériaux > Microscopie. Microscopie électronique à balayage. Cristallographie. Rückstreuung. Rasterelektronenmikroskopie. Kristallographie. Elektronenbeugung. Electronic books.
Online Access:	Connect to the full text of this electronic book