Atomic force microscopy/Scanning tunneling microscopy /

Bibliographic Details
Corporate Authors:	U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium Natick, Mass.), SpringerLink (Online service)
Other Authors:	Cohen, Samuel H. (Editor), Bray, Mona T. (Editor), Lightbody, Marcia L. (Editor)
Format:	Conference Proceeding eBook
Language:	English
Published:	New York : Springer Science + Business Media, 1994.
Subjects:	Atomic force microscopy > Congresses. Scanning tunneling microscopy > Congresses. Analytical biochemistry > Congresses. Microscopy > Congresses. Materials Science. Characterization and Evaluation of Materials. Biological Microscopy. Analytical Chemistry. Atomic/Molecular Structure and Spectra. Analytical biochemistry. Atomic force microscopy. Microscopy. Scanning tunneling microscopy. Electronic books. Conference proceedings.
Online Access:	Connect to the full text of this electronic book

Available Online