The effect of experimental variables on industrial X-ray micro-computed sensitivity /

Bibliographic Details

Main Authors:	Roth, Don J. (Author), Rauser, Richard W. (Author)
Format:	Government Document eBook
Language:	English
Published:	Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, December 2014.
Series:	NASA technical memorandum ; 2014-218332.
Subjects:	Radiography. Computer aided tomography. X ray analysis. Signal to noise ratios. Modulation transfer function.
Online Access:	https://purl.fdlp.gov/GPO/gpo57382 http://purl.fdlp.gov/GPO/gpo57382