Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials : Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1-13 October 2002 /

As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in...

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Bibliographic Details

Corporate Author:	SpringerLink (Online service)
Other Authors:	Vilarinho, Paula Maria (Editor), Kingon, Angus (Editor), Rosenwaks, Yossi (Editor)
Format:	eBook
Language:	English
Published:	Dordrecht : Springer Netherlands, 2005.
Series:	NATO Science Series II: Mathematics, Physics and Chemistry. 186.
Subjects:	Physics. Condensed Matter. Nanotechnology. Optical and Electronic Materials. Surfaces and Interfaces, Thin Films. Condensed matter. Optical materials. Surfaces (Physics)
Online Access:	Connect to the full text of this electronic book