X-ray microscopy II : proceedings of the 2nd International Symposium, Brookhaven, NY, August 31-September 3, 1987 /
| Corporate Authors: | , |
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| Other Authors: | |
| Format: | Conference Proceeding eBook |
| Language: | English |
| Published: |
Berlin ; New York :
Springer-Verlag,
[1988]
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| Series: | Springer series in optical sciences ;
v. 56. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Item Description: | Based on papers presented at the International Symposium on X-ray Microscopy held at Brookhaven National Laboratory. Electronic resource. |
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| Physical Description: | 1 online resource (xiv, 454 pages) : illustrations. |
| Format: | Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. |
| Bibliography: | Includes bibliographical references and indexes. |
| ISBN: | 9783540392460 (electronic bk.) 3540392467 (electronic bk.) |