X-ray microscopy II : proceedings of the 2nd International Symposium, Brookhaven, NY, August 31-September 3, 1987 /
| Corporate Authors: | , |
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| Other Authors: | |
| Format: | Conference Proceeding eBook |
| Language: | English |
| Published: |
Berlin ; New York :
Springer-Verlag,
[1988]
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| Series: | Springer series in optical sciences ;
v. 56. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
Internet
Connect to the full text of this electronic bookAvailable Online
| Call Number: |
QH212.X2 X23 1988 |
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| Call Number | Status | Get It |
| QH212.X2 X23 1988 | Available | |