Advances in scanning probe microscopy /
This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future si...
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| Other Authors: | , |
| Format: | eBook |
| Language: | English |
| Published: |
Berlin ; New York :
Springer,
[2000]
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| Series: | Advances in materials research ;
2. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
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