Advances in scanning probe microscopy /

This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future si...

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Bibliographic Details

Corporate Author:	SpringerLink (Online service)
Other Authors:	Sakurai, T. (Toshio), 1945-, Watanabe, Y. (Yousuke), 1938-
Format:	eBook
Language:	English
Published:	Berlin ; New York : Springer, [2000]
Series:	Advances in materials research ; 2.
Subjects:	Scanning probe microscopy. Rastersondenmikroskopie. Electronic books.
Online Access:	Connect to the full text of this electronic book