Advances in scanning probe microscopy /
This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future si...
| Corporate Author: | |
|---|---|
| Other Authors: | , |
| Format: | eBook |
| Language: | English |
| Published: |
Berlin ; New York :
Springer,
[2000]
|
| Series: | Advances in materials research ;
2. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Summary: | This book covers several of the most important topics of current interest in the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices. |
|---|---|
| Item Description: | Electronic resource. |
| Physical Description: | 1 online resource (xiv, 341 pages) : illustrations. |
| Format: | Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 9783642569494 (electronic bk.) 3642569498 (electronic bk.) |
| ISSN: | 1435-1889 ; |