Secondary ion mass spectrometry : SIMS V : proceedings of the fifth international conference, Washington, DC, September 30-October 4, 1985 /

Bibliographic Details
Corporate Authors: International Conference on Secondary Ion Mass Spectrometry Washington, D.C., SpringerLink (Online service)
Other Authors: Benninghoven, A.
Format: Conference Proceeding eBook
Language:English
Published: Berlin ; New York : Springer-Verlag, [1986]
Series:Springer series in chemical physics ; 44.
Subjects:
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Call Number: QD96.S43 I58 1985
 
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QD96.S43 I58 1985 Available