IC interconnect analysis /

As integrated circuit (IC) feature sizes scaled below a quarter of a micron, thereby defining the deep submicron (DSM) era, there began a gradual shift in the impact on performance due to the metal interconnections among the active circuit components. Once viewed as merely parasitics in terms of the...

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Bibliographic Details
Main Author: Celik, Mustafa, 1966-
Corporate Author: SpringerLink (Online service)
Other Authors: Pileggi, Lawrence, 1962-, Odabasioglu, Altan, 1973-
Format: eBook
Language:English
Published: Boston, Mass. ; London : Kluwer Academic Publishers, [2002]
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Call Number: TK7874.53 .C45 2002eb
 
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