High-resolution X-ray scattering from thin films and multilayers /
This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dy...
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| Other Authors: | , |
| Format: | eBook |
| Language: | English |
| Published: |
Berlin ; New York :
Springer,
[1999]
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| Series: | Springer tracts in modern physics ;
149. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Summary: | This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis. |
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| Item Description: | Electronic resource. |
| Physical Description: | 1 online resource (xi, 256 pages) : illustrations : digital, HTML and PDF files. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 9783540496250 (electronic bk.) 3540496254 (electronic bk.) |
| ISSN: | 1615-0430 ; |