High-resolution X-ray scattering from thin films and multilayers /

This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dy...

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Bibliographic Details

Main Author:	Holý, Václav, 1953-
Corporate Author:	SpringerLink (Online service)
Other Authors:	Pietsch, Ullrich, 1952-, Baumbach, Tilo, 1961-
Format:	eBook
Language:	English
Published:	Berlin ; New York : Springer, [1999]
Series:	Springer tracts in modern physics ; 149.
Subjects:	Thin films > Optical properties. Thin films, Multilayered > Optical properties. X-rays > Scattering. X-rays > Diffraction. Electronic books.
Online Access:	Connect to the full text of this electronic book