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Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits /

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Bibliographic Details
Main Author: Bushnell, Michael L. (Michael Lee), 1950-
Corporate Author: SpringerLink (Online service)
Other Authors: Agrawal, Vishwani D., 1943-
Format: eBook
Language:English
Published: New York : Kluwer Academic, [2002]
Series:Frontiers in electronic testing ; 17.
Subjects:
Integrated circuits > Very large scale integration > Testing.
Digital integrated circuits > Testing.
Mixed signal circuits > Testing.
Semiconductor storage devices > Testing.
Electronic and Computer Engineering.
Computer-Aided Engineering (CAD, CAE) and Design.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:1 online resource (xviii, 690 pages) : illustrations
Bibliography:Includes bibliographical references (pages [631]-670) and index.
ISBN:0306470403 (electronic bk.)
9780306470400 (electronic bk.)