Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits /

Bibliographic Details
Main Author:	Bushnell, Michael L. (Michael Lee), 1950-
Corporate Author:	SpringerLink (Online service)
Other Authors:	Agrawal, Vishwani D., 1943-
Format:	eBook
Language:	English
Published:	New York : Kluwer Academic, [2002]
Series:	Frontiers in electronic testing ; 17.
Subjects:	Integrated circuits > Very large scale integration > Testing. Digital integrated circuits > Testing. Mixed signal circuits > Testing. Semiconductor storage devices > Testing. Electronic and Computer Engineering. Computer-Aided Engineering (CAD, CAE) and Design. Electronic books.
Online Access:	Connect to the full text of this electronic book

Available Online