Transmission electron microscopy of semiconductor nanostructures : an analysis of composition and strain state /

This book provides tools well suited for the quantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductor nanostructures with a spatial resolution at near atomic scales. The book focuses on new methods i...

Full description

Bibliographic Details

Main Author:	Rosenauer, Andreas, 1964-
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	Berlin ; New York : Springer, [2003]
Series:	Springer tracts in modern physics ; 182.
Subjects:	Semiconductors > Analysis. Semiconductors > Microscopy. Transmission electron microscopy. Electronic books.
Online Access:	Connect to the full text of this electronic book