Anomalous X-ray scattering for materials characterization : atomic-scale structure determination /

The evolution of our understanding of most properties of new functional materials is related to our knowledge of their atomic-scale structure. To further this, several X-ray and neutron techniques are employed. The anomalous X-ray scattering (AXS) method, exploiting the so-called anomalous dispersio...

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Bibliographic Details

Main Author:	Waseda, Yoshio
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	Berlin ; New York : Springer, [2002]
Series:	Springer tracts in modern physics ; 179.
Subjects:	X-rays > Scattering. X-ray crystallography. Electronic books.
Online Access:	Connect to the full text of this electronic book