X-ray diffuse scattering from self-organized mesoscopic semiconductor structures /
This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevanc...
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| Format: | eBook |
| Language: | English |
| Published: |
Berlin ; New York :
Springer,
[2004]
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| Series: | Springer tracts in modern physics ;
199. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Summary: | This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments. |
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| Item Description: | Electronic resource. |
| Physical Description: | 1 online resource (x, 202 pages) : illustrations. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 9783540399865 (electronic bk.) 3540399860 (electronic bk.) |
| ISSN: | 0081-3869 ; |