X-ray diffuse scattering from self-organized mesoscopic semiconductor structures /

This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevanc...

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Bibliographic Details

Main Author:	Schmidbauer, Martin, 1962-
Corporate Author:	SpringerLink (Online service)
Format:	eBook
Language:	English
Published:	Berlin ; New York : Springer, [2004]
Series:	Springer tracts in modern physics ; 199.
Subjects:	X-rays > Scattering. Mesoscopic phenomena (Physics) Self-organizing systems. Semiconductors > Surfaces. Electronic books.
Online Access:	Connect to the full text of this electronic book