Hot carrier design considerations for MOS devices and circuits /

Bibliographic Details
Corporate Author:	SpringerLink (Online service)
Other Authors:	Wang, Cheng T.
Format:	eBook
Language:	English
Published:	New York : Van Nostrand Reinhold, [1992]
Subjects:	Metal oxide semiconductors > Design and construction. Metal oxide semiconductors > Reliability. Hei€es Elektron. MOS-Schaltung. Semiconductors Electronic books.
Online Access:	Connect to the full text of this electronic book

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