New approaches to image processing based failure analysis of nano-scale ULSI devices /

Bibliographic Details
Main Author:	Zalevsky, Zeev
Corporate Author:	ebrary, Inc
Other Authors:	Livshits, Pavel, Gur, Eran
Format:	eBook
Language:	English
Published:	Oxford, UK : William Andrew, 2014.
Series:	Micro & nano technologies.
Subjects:	Integrated circuits > Ultra large scale integration > Testing. Nanoelectronics. Microelectronics. Electronic books.
Online Access:	Connect to the full text of this electronic book

Available Online