Optimizing Test Pattern Generation Using Top-Off ATPG Methodology for Stuck-AT, Transition and Small Delay Defect Faults /

Bibliographic Details
Main Author: Gill, Arjun Singh (Author)
Other Authors: Walker, Duncan Moore Henry (Thesis advisor)
Format: Thesis eBook
Language:English
Published: [College Station, Texas] : [Texas A & M University], [2013]
Subjects:
Online Access:Link to OAK Trust copy

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