Optimizing Test Pattern Generation Using Top-Off ATPG Methodology for Stuck-AT, Transition and Small Delay Defect Faults /

Bibliographic Details

Main Author:	Gill, Arjun Singh (Author)
Other Authors:	Walker, Duncan Moore Henry (Thesis advisor)
Format:	Thesis eBook
Language:	English
Published:	[College Station, Texas] : [Texas A & M University], [2013]
Subjects:	Major Computer Engineering. Digital Design Design For Test ATPG Small Delay Defect Top-Off ATPG
Online Access:	Link to OAK Trust copy