Gill, A. S., & Walker, D. M. H. (2013). Optimizing Test Pattern Generation Using Top-Off ATPG Methodology for Stuck-AT, Transition and Small Delay Defect Faults. [Texas A & M University].
Chicago Style (17th ed.) CitationGill, Arjun Singh, and Duncan Moore Henry Walker. Optimizing Test Pattern Generation Using Top-Off ATPG Methodology for Stuck-AT, Transition and Small Delay Defect Faults. [College Station, Texas]: [Texas A & M University], 2013.
MLA (9th ed.) CitationGill, Arjun Singh, and Duncan Moore Henry Walker. Optimizing Test Pattern Generation Using Top-Off ATPG Methodology for Stuck-AT, Transition and Small Delay Defect Faults. [Texas A & M University], 2013.
Warning: These citations may not always be 100% accurate.