Scanning probe microscopy in industrial applications : nanomechanical characterization /

Bibliographic Details
Corporate Author: ebrary, Inc
Other Authors: Yablon, Dalia G., 1975- (Editor)
Format: eBook
Language:English
Published: Hoboken, New Jersey : John Wiley & Sons, [2014]
Subjects:
Online Access:Connect to the full text of this electronic book

Internet

Connect to the full text of this electronic book

Available Online

Holdings details from Available Online
Call Number: TA417.23 .S33 2014
 
Call Number Status Get It
TA417.23 .S33 2014 Available