An Integrative Approach to Reliability Analysis of an IEC 61850 Digital Substation /

Bibliographic Details
Main Author: Zhang, Yan (Author)
Other Authors: Singh, Chanan (Thesis advisor), Sprintson, Alex (Thesis advisor)
Format: Thesis eBook
Language:English
Published: [College Station, Texas] : [Texas A & M University], [2013]
Subjects:
Online Access:Link to OAK Trust copy

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Link to OAK Trust copy

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Holdings details from Available Online
Call Number: 2012 Thesis 1969.1/148391
 
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2012 Thesis 1969.1/148391 Available