Proceedings of the First International Symposium On Analytical Methods In Philately /

Bibliographic Details
Corporate Author: International Symposium on Analytical Methods in Philately Washington, DC
Other Authors: Lera, Thomas M., Barwis, John H., Herendeen, David L., -2013
Format: Government Document Conference Proceeding Book
Language:English
Published: Washington, D.C. : Smithsonian Institution Scholarly Press, [2013]
Series:Smithsonian contributions to history and technology. number 57.
Subjects:

Evans: US Documents (Annex 5th floor)

Holdings details from Evans: US Documents (Annex 5th floor)
Call Number: SI 1.28:57
 
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SI 1.28:57 Available