Cover Image

Systematic destruction of electronic parts for aid in electronic failure analysis /

Bibliographic Details
Main Authors: Decker, S. E. (Author), Rolin, T. D. (Author), McManus, P. D. (Author)
Format: Government Document eBook
Language:English
Published: Huntsville, Alabama : National Aeronautics and Space Administration, Marshall Space Flight Center, 2012.
Series:NASA technical memorandum ; 2012-217463.
Subjects:
Failure analysis.
Electromechanics.
Electric potential.
Transistors.
Avionics.
Failure modes.
Online Access:https://purl.fdlp.gov/GPO/gpo32501
Description
Item Description:Title from title screen (viewed on Dec. 26, 2012).
"June 2012."
Physical Description:1 online resource (ix, 33 pages) : color illustrations.
Bibliography:Includes bibliographical references (page 33).