Systematic destruction of electronic parts for aid in electronic failure analysis /

Bibliographic Details

Main Authors:	Decker, S. E. (Author), Rolin, T. D. (Author), McManus, P. D. (Author)
Format:	Government Document eBook
Language:	English
Published:	Huntsville, Alabama : National Aeronautics and Space Administration, Marshall Space Flight Center, 2012.
Series:	NASA technical memorandum ; 2012-217463.
Subjects:	Failure analysis. Electromechanics. Electric potential. Transistors. Avionics. Failure modes.
Online Access:	https://purl.fdlp.gov/GPO/gpo32501