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Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /

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Bibliographic Details
Main Author: Klapetek, Petr
Corporate Author: ebrary, Inc
Format: eBook
Language:English
Published: Waltham, Mass. : Elsevier, 2013.
Subjects:
Scanning probe microscopy.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:1 online resource (xi, 321 pages) : illustrations
Bibliography:Includes bibliographical references and index.