Quantitative data processing in scanning probe microscopy : SPM applications for nanometrology /

Bibliographic Details

Main Author:	Klapetek, Petr
Corporate Author:	ebrary, Inc
Format:	eBook
Language:	English
Published:	Waltham, Mass. : Elsevier, 2013.
Subjects:	Scanning probe microscopy. Electronic books.
Online Access:	Connect to the full text of this electronic book