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Applied logistic regression /

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Bibliographic Details
Main Author: Hosmer, David W.
Other Authors: Lemeshow, Stanley
Format: eBook
Language:English
Published: New York : Wiley, [2000]
Edition:2nd ed.
Series:Wiley series in probability and statistics. Texts and references section.
Subjects:
Regression analysis.
MATHEMATICS > Probability & Statistics > Regression Analysis.
Electronic books.
Online Access:Connect to the full text of this electronic book
Description
Item Description:"A Wiley-Interscience publication."
Electronic resource.
Physical Description:1 online resource (xii, 375 pages) : illustrations
Bibliography:Includes bibliographical references (pages 354-367) and index.
ISBN:0471654027 (electronic bk.)
9780471654025 (electronic bk.)
9780471722144 (electronic bk.)
0471722146 (electronic bk.)