Applied logistic regression /

Bibliographic Details
Main Author:	Hosmer, David W.
Other Authors:	Lemeshow, Stanley
Format:	eBook
Language:	English
Published:	New York : Wiley, [2000]
Edition:	2nd ed.
Series:	Wiley series in probability and statistics. Texts and references section.
Subjects:	Regression analysis. MATHEMATICS > Probability & Statistics > Regression Analysis. Electronic books.
Online Access:	Connect to the full text of this electronic book

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