Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate /

Bibliographic Details
Corporate Author: Langley Research Center
Other Authors: Kim, Hyun Jung
Format: Government Document eBook
Language:English
Published: Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [2012]
Series:NASA technical memorandum ; 2012-217597.
Subjects:
Online Access:https://purl.fdlp.gov/GPO/gpo30968

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