Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate /

Bibliographic Details

Corporate Author:	Langley Research Center
Other Authors:	Kim, Hyun Jung
Format:	Government Document eBook
Language:	English
Published:	Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [2012]
Series:	NASA technical memorandum ; 2012-217597.
Subjects:	Ion beams. Sapphire. Transmission electron microscopy. X ray diffraction. Single crystals. Rhombohedrons. Germanium. Density measurement. Crystal structure.
Online Access:	https://purl.fdlp.gov/GPO/gpo30968