Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate /

Bibliographic Details
Corporate Author: Langley Research Center
Other Authors: Kim, Hyun Jung
Format: Government Document eBook
Language:English
Published: Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [2012]
Series:NASA technical memorandum ; 2012-217597.
Subjects:
Online Access:https://purl.fdlp.gov/GPO/gpo30968

MARC

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245 0 0 |a Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate /  |c Hyun Jung Kim [and others]. 
246 3 |a Transmission electron microscopy (TEM) sample preparation of Si1-xGex in c-plane sapphire substrate 
264 1 |a Hampton, Va. :  |b National Aeronautics and Space Administration, Langley Research Center,  |c [2012] 
300 |a 1 online resource (ix, 29 pages) :  |b illustrations (some color). 
336 |a text  |b txt  |2 rdacontent 
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490 1 |a NASA/TM ;  |v 2012-217597 
500 |a Title from title screen (viewed on Nov. 7, 2012). 
500 |a "August 2012." 
504 |a Includes bibliographical references (page 29). 
536 |a Sponsored by National Aeronautics and Space Administration  |h 392259.02.07.9923.11 
536 |d L-20166 
500 |a Electronic resource. 
650 7 |a Ion beams.  |2 nasat 
650 7 |a Sapphire.  |2 nasat 
650 7 |a Transmission electron microscopy.  |2 nasat 
650 7 |a X ray diffraction.  |2 nasat 
650 7 |a Single crystals.  |2 nasat 
650 7 |a Rhombohedrons.  |2 nasat 
650 7 |a Germanium.  |2 nasat 
650 7 |a Density measurement.  |2 nasat 
650 7 |a Crystal structure.  |2 nasat 
700 1 |a Kim, Hyun Jung. 
710 2 |a Langley Research Center. 
830 0 |a NASA technical memorandum ;  |v 2012-217597. 
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