Cover Image

Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate /

Bibliographic Details
Corporate Author: Langley Research Center
Other Authors: Kim, Hyun Jung
Format: Government Document eBook
Language:English
Published: Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center, [2012]
Series:NASA technical memorandum ; 2012-217597.
Subjects:
Ion beams.
Sapphire.
Transmission electron microscopy.
X ray diffraction.
Single crystals.
Rhombohedrons.
Germanium.
Density measurement.
Crystal structure.
Online Access:https://purl.fdlp.gov/GPO/gpo30968
Description
Item Description:Title from title screen (viewed on Nov. 7, 2012).
"August 2012."
Electronic resource.
Physical Description:1 online resource (ix, 29 pages) : illustrations (some color).
Bibliography:Includes bibliographical references (page 29).