APA (7th ed.) Citation

Langley Research Center & Kim, H. J. (2012). Transmission electron microscopy (TEM) sample preparation of Si[subscript 1-x]Ge[subscript x] in c-plane sapphire substrate. National Aeronautics and Space Administration, Langley Research Center.

Chicago Style (17th ed.) Citation

Langley Research Center and Hyun Jung Kim. Transmission Electron Microscopy (TEM) Sample Preparation of Si[subscript 1-x]Ge[subscript X] in C-plane Sapphire Substrate. Hampton, Va.: National Aeronautics and Space Administration, Langley Research Center, 2012.

MLA (9th ed.) Citation

Langley Research Center and Hyun Jung Kim. Transmission Electron Microscopy (TEM) Sample Preparation of Si[subscript 1-x]Ge[subscript X] in C-plane Sapphire Substrate. National Aeronautics and Space Administration, Langley Research Center, 2012.