Fourth optical inspection of integrated circuits using image processing and mathematical morphology : a report /

Bibliographic Details
Main Author:	Chemaly, Ephrem A.
Corporate Author:	Texas A & M University. College of Engineering
Format:	Manuscript
Language:	English
Published:	[Place of publication not identified] : [publisher not identified] ; 1986.
Subjects:	Electrical engineering > Texas > Austin. Microprocessors > Texas > Austin > Design and construction. Quality control > Texas > Austin > Optical methods. Image processing > Mathematics. Integrated circuits > Inspection > Automation. Motorola, Inc. Major Electrical Engineering.
Online Access:	Link to OAK Trust copy

Link to OAK Trust copy

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