Atomic force microscopy : exploring basic modes and advanced applications /

Bibliographic Details
Main Author: Haugstad, Greg, 1963-
Format: eBook
Language:English
Published: Hoboken, N.J. : John Wiley & Sons, [2012]
Series:Wiley Online Library.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:1 online resource (xxii, 464 pages) : illustrations
Bibliography:Includes bibliographical references.
ISBN:1118360664 (electronic bk.)
9781118360668 (electronic bk.)
DOI:10.1002/9781118360668