Atomic force microscopy : exploring basic modes and advanced applications /

Bibliographic Details

Main Author:	Haugstad, Greg, 1963-
Format:	eBook
Language:	English
Published:	Hoboken, N.J. : John Wiley & Sons, [2012]
Series:	Wiley Online Library.
Subjects:	Atomic force microscopy. Electronic books.
Online Access:	Connect to the full text of this electronic book