Cover Image

Junction-to-case thermal resistance of a silicon carbide bipolar junction transistor measured /

Bibliographic Details
Main Author: Niedra, Janis M.
Corporate Authors: NASA Glenn Research Center, QSS Group, Inc
Format: Government Document eBook
Language:English
Published: Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, [2006]
Series:NASA contractor report ; NASA CR-2006-214228.
Subjects:
Junction transistors.
Temperature measurement.
Bipolar transistors.
Electric potential.
Pulse amplitude.
Thermal resistance.
Silicon carbides.
Online Access:https://purl.fdlp.gov/GPO/gpo22777
Description
Item Description:Title from title screen (viewed on May 16, 2012).
"November 2006."
"Preparing organization, QSS Group, Inc."--Rept. documentation p.
Electronic resource.
Physical Description:1 online resource (11 pages) : illustrations
Bibliography:Includes bibliographical references (page 11).