Junction-to-case thermal resistance of a silicon carbide bipolar junction transistor measured /

Bibliographic Details

Main Author:	Niedra, Janis M.
Corporate Authors:	NASA Glenn Research Center, QSS Group, Inc
Format:	Government Document eBook
Language:	English
Published:	Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, [2006]
Series:	NASA contractor report ; NASA CR-2006-214228.
Subjects:	Junction transistors. Temperature measurement. Bipolar transistors. Electric potential. Pulse amplitude. Thermal resistance. Silicon carbides.
Online Access:	https://purl.fdlp.gov/GPO/gpo22777