Cover Image

X-ray topography /

Bibliographic Details
Main Author: Black, David R.
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Long, Gabrielle G.
Format: Government Document eBook
Language:English
Published: [Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2004]
Series:NIST recommended practice guide.
NIST special publication ; 960-10.
Subjects:
X-rays > Diffraction.
X-ray crystallography.
Online Access:https://purl.fdlp.gov/GPO/gpo14809

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