X-ray topography /

Bibliographic Details
Main Author:	Black, David R.
Corporate Author:	National Institute of Standards and Technology (U.S.)
Other Authors:	Long, Gabrielle G.
Format:	Government Document eBook
Language:	English
Published:	[Gaithersburg, Md.] : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology, [2004]
Series:	NIST recommended practice guide. NIST special publication ; 960-10.
Subjects:	X-rays > Diffraction. X-ray crystallography.
Online Access:	https://purl.fdlp.gov/GPO/gpo14809

Available Online