Built-in self test (BIST) for realistic delay defects /

Bibliographic Details

Main Author:	Tamilarasan, Karthik Prabhu
Other Authors:	Walker, Duncan Moore Henry (Thesis advisor), Choi, Seong Gwan (Thesis advisor)
Format:	Thesis eBook
Language:	English
Published:	[College Station, Tex.] : [Texas A&M University], [2012]
Subjects:	Major computer engineering. small delay defects Delay test weighted random pattern generation
Online Access:	Link to OAK Trust copy