In the matter of certain probe card assemblies, components thereof and certain tested DRAM an NAND flash memory devices and products containing same : investigation no. 337-TA-621.

Bibliographic Details
Corporate Author: United States International Trade Commission
Format: Government Document eBook
Language:English
Published: Washington, DC : U.S. International Trade Commission, [2010]
Series:USITC publication ; 4149.
Subjects:
Online Access:https://purl.fdlp.gov/GPO/gpo15315
Description
Item Description:Title from title screen (viewed on Nov. 17, 2011).
"June 2010."
Electronic resource.
Physical Description:1 online resource (243 unnumbered pages) : illustrations
Bibliography:Includes bibliographical references.