In the matter of certain probe card assemblies, components thereof and certain tested DRAM an NAND flash memory devices and products containing same : investigation no. 337-TA-621.

Bibliographic Details

Corporate Author:	United States International Trade Commission
Format:	Government Document eBook
Language:	English
Published:	Washington, DC : U.S. International Trade Commission, [2010]
Series:	USITC publication ; 4149.
Subjects:	Semiconductor storage devices. Flash memories (Computers) Computer storage devices. Patent infringement.
Online Access:	https://purl.fdlp.gov/GPO/gpo15315