Atomic force microscopy based nanorobotics : modelling, simulation, setup building and experiments /

Bibliographic Details

Other Authors:	Xie, Hui
Format:	eBook
Language:	English
Published:	Berlin ; New York : Springer, [2011]
Series:	Springer tracts in advanced robotics ; v.71.
Subjects:	Atomic force microscopy. Microrobots. Robotics. Artificial Intelligence (incl. Robotics) Engineering Nanotechnology and Microengineering Robotics and Automation Electronic books.
Online Access:	Connect to the full text of this electronic book